Read or Download C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits PDF
Best circuits books
For one-quarter/semester, senior/graduate point classes in Fabrication techniques. specified in procedure, this article presents an built-in view of silicon technology--with an emphasis on smooth desktop simulation. It describes not just the producing perform linked to the applied sciences utilized in silicon chip fabrication, but additionally the underlying medical foundation for these applied sciences.
Microdisplays are monitors requiring optical magnification and OLEDs (Organic Light-Emitting Diode) are self-emitting monitors the place every one pixel encompasses a LED made from natural fabric, ordinarily composed of small-molecule natural fabric. This name stories intimately how OLED microdisplays are made in addition to how they're used.
This booklet is ready the Arduino microcontroller and the Arduino proposal. The visionary Arduino staff of Massimo Banzi, David Cuartielles, Tom Igoe, Gianluca Martino, and David Mellis introduced a brand new innovation in microcontroller in 2005, the idea that of open resource undefined. Their technique used to be to overtly percentage information of microcontroller-based layout systems to stimulate the sharing of principles and advertise innovation.
This ebook offers readers an intensive knowing of the applicability of new-generation silicon-germanium (SiGe) digital subsystems for digital struggle and protective countermeasures in army contexts. It explains intimately the theoretical and technical historical past, and addresses all elements of the combination of SiGe as an permitting expertise for maritime, land, and airborne / spaceborne digital war, together with study, layout, improvement, and implementation.
Additional resources for C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
After application of the current impulse, the surge protector shall be tested for any relevant failure modes (see Clause 9), which shall then be verified. Terminal combinations appropriate to the application shall be specified for testing. For basic Configuration 4, terminals X1, X 2 or Y 1, Y2 may be connected together to create a common terminal for the simultaneous test. Different peak current levels and waveforms may be appropriate for various combinations of surge protector terminals. None of the relevant failure modes shall occur.
6 Current reset test The purpose of this test is to verify that resettable, series-connected, current-protective devices in a surge protector revert to their quiescent state within a specified duration after having limited an abnormal current. 1 The surge protector, mounted as intended to be used, shall be placed in a chamber maintained at the specified test temperature. The air flow shall be controlled to provide a free-convection heat-transfer environment, unless otherwise specified. The surge protector shall be allowed to stabilize at the test temperature.
1—Terminal connections for multiport surge protectors 48 Unshielded paired conductor Shielded paired conductor X1 Outside plant Tip Outside plant Tip X2 Outside plant Ring Outside plant Ring CX N/A Outside plant shield Y1 Terminal equipment or central office Tip Terminal equipment or CO Tip Y2 Terminal equipment or CO office Ring Terminal equipment or CO Ring CY N/A Terminal equipment or CO shield Coaxial Twinaxial W1 Outside plant center conductor Outside plant center Conductor 1 W2 N/A Outside plant center Conductor 2 CW Outside plant shield Outside plant shield Z1 Terminal equipment center conductor Terminal equipment center Conductor 1 Z2 N/A Terminal equipment center Conductor 2 CZ Terminal equipment shield Terminal equipment shield AC power (mains) Copyright © 2000 IEEE.
C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits by IEEE